The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Oct. 02, 2007
Kang Kim, Ann Arbor, MI (US);
William F. Weitzel, Ypsilanti, MI (US);
Jonathan M. Rubin, Ann Arbor, MI (US);
Congxian Jia, Ann Arbor, MI (US);
Matthew O'donnell, Seattle, WA (US);
Theodore J. Kolias, Ann Arbor, MI (US);
Kang Kim, Ann Arbor, MI (US);
William F. Weitzel, Ypsilanti, MI (US);
Jonathan M. Rubin, Ann Arbor, MI (US);
Congxian Jia, Ann Arbor, MI (US);
Matthew O'Donnell, Seattle, WA (US);
Theodore J. Kolias, Ann Arbor, MI (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
An optimized elastic modulus reconstruction procedure can estimate the nonlinear elastic properties of vascular wall from intramural strain and pulse wave velocity (PWV) measurements. A noninvasive free-hand ultrasound scanning procedure is used to apply external force, comparable to the force in measuring a subject's blood pressure, to achieve higher strains by equalizing the internal arterial baseline pressure. PWV is estimated at the same location where intramural strain is measured. The reconstructed elastic modulus is optimized and the arterial elastic modulus can be determined and monitored using a simple dual elastic modulus reconstruction procedure.