The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Jan. 15, 2009
Applicant:
John Steffen Jensen, Santa Cruz, CA (US);
Inventor:
John Steffen Jensen, Santa Cruz, CA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Temperature measurement instruments and methods are provided for visually identifying a selected area of a target with a light beam. After imaging infrared radiation from a measurement area on a target, a selected area satisfying a temperature criterion is determined. An actuator system moves a light beam relative to the instrument and measurement area to visually identify the selected area. In some embodiments the actuator system may repeatedly move the light beam to visually identify the selected area of the target as the instrument is moved and the selected area's position changes within the measurement area.