The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Nov. 07, 2005
Richard Ding LI, Somerville, MA (US);
William F. Peck, Douglas, MA (US);
Adriaan Van DE Ven, Boekel, NL;
Richard Ding Li, Somerville, MA (US);
William F. Peck, Douglas, MA (US);
Adriaan van de Ven, Boekel, NL;
Red Hat, Inc., Raleigh, NC (US);
Abstract
Embodiments of the present invention provide methods and systems for automated distributed testing of software. A testing service may utilize a distributed architecture that provides a standardized framework for writing tests, scheduling the tests, and gathering and reporting results of the tests. Multiple distributed labs are integrated into the testing service and their environments can be centrally managed by the testing service. The testing service permits the scheduling and performance of tests across multiple machines within a test lab, or tests that span across multiple test labs. Any of the machines in the test labs may be selected based on variety of criteria. The testing service may then automatically locate the appropriate machines that match or satisfy the criteria and schedule the tests when the machines are available. The testing service may also automatically create and set up a desired test environment according to the desired specifications for the test.