The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Oct. 25, 2004
Applicants:

Anapathur V. Ramesh, Bothell, WA (US);

Paul M. Covert, Lynnwood, WA (US);

Stephen C. Rhodes, Lake Stevens, WA (US);

Scott C. Hunter, Bothell, WA (US);

John L. Vian, Renton, WA (US);

Timothy J. Wilmering, Saint Charles, MO (US);

Inventors:

Anapathur V. Ramesh, Bothell, WA (US);

Paul M. Covert, Lynnwood, WA (US);

Stephen C. Rhodes, Lake Stevens, WA (US);

Scott C. Hunter, Bothell, WA (US);

John L. Vian, Renton, WA (US);

Timothy J. Wilmering, Saint Charles, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 99/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method and system quantify the impact of various design and operational solutions for equipment modules of a structure and the overall structure based upon economic factors. In particular, the method and system provide cost evaluation of various maintenance approaches for at least one equipment module that is part of an overall structure. In addition, a baseline and alternate equipment module may be specified for each equipment module. The costs associated with each of the maintenance approaches for each baseline and alternate equipment module then may be compared and the costs associated with the overall structure having a chosen maintenance approach for each baseline and alternate equipment module may be evaluated. The sensitivity of the costs associated with the overall structure to changes in one or more of the parameter values also may be calculated.


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