The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Jun. 23, 2009
Johan DE Kleer, Los Altos, CA (US);
Lukas Daniel Kuhn, Palo Alto, CA (US);
Robert Price, Palo Alto, CA (US);
Minh Binh DO, Mountain View, CA (US);
Rong Zhou, Cupertino, CA (US);
Juan Liu, Milpitas, CA (US);
Eric Saund, San Carlos, CA (US);
Johan de Kleer, Los Altos, CA (US);
Lukas Daniel Kuhn, Palo Alto, CA (US);
Robert Price, Palo Alto, CA (US);
Minh Binh Do, Mountain View, CA (US);
Rong Zhou, Cupertino, CA (US);
Juan Liu, Milpitas, CA (US);
Eric Saund, San Carlos, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
Production control systems and methods are presented for estimation of production resource failure probabilities in which a set of four count values are maintained and updated for each resource including a first count value mindicating a number of plans where the resource m was used and failed, a second count value mindicating a number of plans where the resource m was used and succeeded, a third count value mindicating a number of plans where the resource m was not used and failed, and a fourth count value mindicating a number of plans where the resource m was not used and succeeded, and the current fault probability for each resource is estimated and stored for single or multiple, persistent or intermittent faults based on the corresponding count values.