The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Jul. 16, 2009
Applicant:

Masatoshi Kagawa, Tokyo, JP;

Inventor:

Masatoshi Kagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/04 (2006.01); H04B 10/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus detecting an optical carrier phase difference between adjacent optical pulses structuring an OTDM-DPSK signal, by generally-used optical and electrical elements, is provided. An OTDM-DPSK signal generating section has an optical splitter, a first phase modulator, a second phase modulator, an optical coupler, and a monitor signal branching device, and generates and outputs an OTDM-DPSK signal and a monitor signal. An optical carrier phase difference detecting section has an optical carrier interferometer, and an interference signal detecting section including a optical-to-electrical converter and a peak detection circuit. The monitor signal is inputted to the optical carrier interferometer, and an interference monitor signal is outputted. The interference monitor signal is inputted to the optical-to-electrical converter, and an electrical interference monitor signal is outputted. The electrical interference monitor signal is inputted to the peak detection circuit, and an optical carrier phase difference detection signal is generated and outputted.


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