The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8165356 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 24, 2012

Filed:

May. 17, 2007
Applicants:

Dong-jae Lee, Seoul, KR;

Jun-sung Yoon, Seoul, KR;

Won-churl Jang, Seoul, KR;

Deok-soo Park, Seoul, KR;

Inventors:

Dong-Jae Lee, Seoul, KR;

Jun-sung Yoon, Seoul, KR;

Won-churl Jang, Seoul, KR;

Deok-soo Park, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining acceptability of an image of a fingerprint to be analyzed, includes dividing the image into a plurality of blocks, determining a focus for each block, determining a validity of a block, the block being valid if the focus is sufficient, otherwise the block being invalid, totaling a number of valid blocks in the image, and determining a validity of the image, the image being valid if a number of valid blocks is sufficient.


Find Patent Forward Citations

Lee, Dong-Jae. (2012). Apparatus and method for determining the acceptability of a fingerprint image to be analyzed (U.S. Patent No. 8165356). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8165356

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