The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
May. 30, 2008
Bang Wang, Singapore, SG;
Hong Tat Toh, Singapore, SG;
Koh Wei Chien, Singapore, SG;
Takahisa Aoyama, Kanagawa, JP;
Bang Wang, Singapore, SG;
Hong Tat Toh, Singapore, SG;
Koh Wei Chien, Singapore, SG;
Takahisa Aoyama, Kanagawa, JP;
Panasonic Corporation, Osaka, JP;
Abstract
Disclosed is a gap support measuring method which performs autonomous gap allocation without lowering the data transfer rate or the throughput. STacquires various kinds of parameters decided by a network so as to execute a gap support measurement task. STchecks the current time and starts the gap support measurement task when the current time has become Ts. STjudges whether CQI measured by a terminal is lower than a threshold value. STjudges whether the threshold value should be updated. STdecides the gap length according to the remaining gap length and the remaining time and performs measurement within the gap. STjudges whether the measurement is complete. STchecks whether the total of the gaps exceed the entire gap length Tg.