The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Feb. 08, 2008
Applicants:

Yuuichi Kuze, Osaka, JP;

Akira Yoshikawa, Nara, JP;

Katsuya Watanabe, Nara, JP;

Inventors:

Yuuichi Kuze, Osaka, JP;

Akira Yoshikawa, Nara, JP;

Katsuya Watanabe, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The optical disc apparatus of this invention includes: an optical pickup, which irradiates an optical disc with a light beam and generates a light detection signal based on the beam reflected from the disc; a search section, which controls the pickup before data is written on a storage area of the disc, thereby adjusting the beam spot location and searching a reference one of information layers stacked for a defective area in the storage area of the disc; a defect decision section for detecting an error based on the detection signal and determining a portion of the storage area, where the error has occurred, as the defective area; a defect size measuring section for measuring the size of the defective area in an area of the reference layer and generating a defect information list indicating there is the defective area in the area of the reference layer; and a recording range control section for managing, by reference to the list, the storage area such that no data will be written on a perpendicularly projected area defined by projecting the defective area of the reference layer perpendicularly to another information layer.


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