The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Dec. 16, 2008
Xueshi Yang, Cupertino, CA (US);
Yu-yao Chang, Sunnyvale, CA (US);
Michael Madden, Mountain View, CA (US);
Zining Wu, Los Altos, CA (US);
Xueshi Yang, Cupertino, CA (US);
Yu-Yao Chang, Sunnyvale, CA (US);
Michael Madden, Mountain View, CA (US);
Zining Wu, Los Altos, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Methods, systems and computer program products for performing hybrid defect detection are disclosed. A hybrid defect detection mechanism may be used to detect various classes of defects (e.g., long and shallow defects, and short and deep defects) while reducing the probability of a miss or false alarm. In some implementations, the hybrid defect detection mechanism may utilize a defect detector that includes one or more defect sub-detectors. Each defect sub-detector may be associated with an individual threshold and sliding window length to enhance the hybrid defect detection process that maximizes the detection of a specific type or class of defects.