The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Nov. 19, 2007
Norifumi Ikeda, Fujisawa, JP;
Nobuaki Tanaka, Fujisawa, JP;
Koichi Morita, Fujisawa, JP;
NSK Ltd., Tokyo, JP;
Abstract
Disclosed is an observable centrifugal apparatus capable of checking in real time a state of a sample during reaction of separation or synthesization in the form of a stable and high-quality image at a high frame rate. An observable centrifugal apparatus A has a rotary discrotating about a rotary shaft, a reactordisposed on the rotary disc and rotating together with the rotary disc while accommodating a sample, and a microscopefor observing a state of the sample within the reactor, in which predetermined substances of the sample are separated or synthesized by applying a centrifugal force to the sample within the reactor. The microscope is fixed in a predetermined position on the rotary disc so as to enable the state of the sample within the reactor to be observed, and the rotary disc is fitted with an imaging devicefor photographing the state of the sample, caught by the microscope, within the reactor and a microscope image, and with an image wireless transmission devicefor wirelessly transmitting in real time the photographed image of the microscope image photographed by the imaging device as a dynamic image.