The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Dec. 13, 2007
Applicants:

Alexander F. H. Goetz, Boulder, CO (US);

Leonid G. Feldman, Broomfield, CO (US);

Thomas Ciupak, Longmont, CO (US);

Robert J. Faus, Longmont, CO (US);

Brian Curtiss, Boulder, CO (US);

Inventors:

Alexander F. H. Goetz, Boulder, CO (US);

Leonid G. Feldman, Broomfield, CO (US);

Thomas Ciupak, Longmont, CO (US);

Robert J. Faus, Longmont, CO (US);

Brian Curtiss, Boulder, CO (US);

Assignee:

ASD, Inc, Boulder, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for optical spectroscopic measurements is described. One embodiment includes a measurement head for optical spectroscopic measurements, the measurement head comprising an illumination source configured to illuminate a sample, a collection optic configured to view the sample, and an internal reference, wherein the internal reference can be illuminated by the illumination source and viewed by the collection optic.


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