The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Jan. 23, 2007
Applicants:

Kiyoshi Tateishi, Tsurugashima, JP;

Takanori Maeda, Tsurugashima, JP;

Inventors:

Kiyoshi Tateishi, Tsurugashima, JP;

Takanori Maeda, Tsurugashima, JP;

Assignee:

Pioneer Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A capacitance detecting apparatus which can detect the change in minute capacitance of a measuring object with high sensitivity comprises a signal generator, a differential amplifying circuit, and a detecting unit. The signal generator generates a probe signal w(t) to be applied to one end of the measuring object. The differential amplifying circuit amplifies differentially a response signal v() developed at the other end of the measuring object in response to the application of the probe signal w(t) and the probe signal w(t). The detecting unit detects capacitance change of the measuring object based on the amplified signal v(t) from the differential amplifying circuit.


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