The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
May. 28, 2009
Daniel Rugar, Los Altos, CA (US);
Harry Jonathon Mamin, Palo Alto, CA (US);
Tjerk Hendrik Oosterkamp, Leiden, NL;
Daniel Rugar, Los Altos, CA (US);
Harry Jonathon Mamin, Palo Alto, CA (US);
Tjerk Hendrik Oosterkamp, Leiden, NL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A magnetic resonance force detection apparatus, comprising a sample carrier for carrying a sample to be tested, a magnetic field source and a support for supporting either the sample carrier or the magnetic field source. The magnetic field source is configured to expose the sample to a magnetic field by simultaneously providing a plurality of volumes in which the magnetic field is configured to cause the spins of one or more nuclei or electrons in the sample to flip, and wherein the flipping of spins exerts a force on the support. The apparatus also comprises a support displacement measuring sensor configured to measure the displacement of the support and generate a signal representative of the displacement of the support, and a processor configured to process the signal representative of the displacement of the support in order to determine a component of the displacement of the support caused by one or more of the plurality of volumes.