The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Mar. 26, 2009
Applicants:

Takakazu Imai, Tokyo, JP;

Junya Fukuda, Tokyo, JP;

Kei Tanabe, Tokyo, JP;

Inventors:

Takakazu Imai, Tokyo, JP;

Junya Fukuda, Tokyo, JP;

Kei Tanabe, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The magnetic field measurement method has: a step of preparing a magnetic sensor which includes: a magneto-resistive effect element having a magnetization-free layer and a magnetization fixed layer, and having a longitudinal direction; and magnetic field application means, wherein the magnetization direction of the magnetization fixed layer is fixed in a direction which forms an angle equal to or less than 45 degrees to the longitudinal direction, and a magnetic field generated by the magnetic field application means forms an angle equal to or less than 45 degrees to the longitudinal direction; a step of saturating the magnetization of the magnetization-free layer by the magnetic field application means and magnetizing the magnetization-free layer in one direction in the longitudinal direction; and a step of measuring the strength of an external magnetic field by applying the external magnetic field to the magnetization-free layer in the other direction in the longitudinal direction.


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