The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Apr. 30, 2009
Alan C. Bovik, Austin, TX (US);
Mia K. Markey, Austin, TX (US);
Mehul Sampat, Sunnyvale, CA (US);
Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
A method and apparatus detects one or more spiculated masses in an image using a processor. The image is received in the processor. The received image is filtered using one or more Gaussian filters to detect one or more central mass regions. The received image is also filtered using one or more spiculated lesion filters to detect where the one or more spiculated masses converge. In addition, the received image is filtered using one or more Difference-of-Gaussian filters to suppress one or more linear structures. An enhanced image showing the detected spiculated masses is created by combining an output from all of the filtering steps. The enhanced image is then provided to an output of the processor.