The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Jul. 01, 2008
Applicants:

Masao Mizuno, Kobe, JP;

Takayuki Hirano, Kobe, JP;

Katsufumi Tomihisa, Kobe, JP;

Inventors:

Masao Mizuno, Kobe, JP;

Takayuki Hirano, Kobe, JP;

Katsufumi Tomihisa, Kobe, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01K 11/00 (2006.01); G01K 3/00 (2006.01); G01K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The surface density of projections formed on a thin metal film of a temperature-measuring member having the metal film having been subjected to a temperature profile is calculated with a number-calculating section according to image data fed into an arithmetic processing unit through an optical microscope, CCD camera, and I/O board. The maximum temperature of the object is determined with the temperature-calculating unit according to the surface density and data on the maximum temperature and surface density previously stored in memory. Furthermore, a temperature-measuring member constituted by a thin aluminum film arranged on a substrate is used. A reduction in the reflectivity of the film due to projections formed on the film surface according to a temperature profile to which the member has been subjected is measured. The maximum temperature in the temperature profile is estimated according to the reduction in reflectivity.


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