The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Jul. 31, 2007
Bartosz Henryk Paliswiat, Kirkland, WA (US);
Yasser Mufti, Seattle, WA (US);
Bartosz Henryk Paliswiat, Kirkland, WA (US);
Yasser Mufti, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Technologies for performing positive and negative event-based testing of systems such as software and the like. Such technologies may be applied to any type of system for which activities and state changes and the like can be monitored. Event monitors are typically established to monitor each type of event of interest, including negative events. Such event monitors detect corresponding system activity, state changes, and the like and describe such as events that are placed in an event queue. The present invention provides technologies and methods for comparing these events to expected events, thus enabling positive testing. Such expected events may be expected to occur sequentially (one after another in a specified order) or in parallel (multiple events wherein the order of the events is irrelevant) or any combination of the two. Further, unexpected events are noted as well, thus enabling negative testing.