The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Sep. 27, 2007
Darrin P. Johnson, San Jose, CA (US);
Damien Farnham, Dublin, IE;
Fintan Ryan, Dublin, IE;
Sean A. Mcgrath, Dublin, IE;
Darrin P. Johnson, San Jose, CA (US);
Damien Farnham, Dublin, IE;
Fintan Ryan, Dublin, IE;
Sean A. McGrath, Dublin, IE;
Oracle America, Inc., Redwood City, CA (US);
Abstract
Techniques for efficiently isolating software regressions are provided. A system test tool determines that a particular regression is present in a particular build of a software system, but not in a baseline build. Using historical data, the tool determines, for each of a plurality of intermediate builds between these two builds, a likelihood that that intermediate build introduced the particular regression. A particular intermediate build can be identified as a build to be tested. Here, the particular intermediate build comprises a plurality of layered putbacks, each of which putbacks comprises one or more code changes in the software system. The tool determines, for each putback, a likelihood that that putback introduced the particular regression. A particular putback in the plurality of putbacks may be selected as a putback to be tested. In some embodiments, the particular putback is the putback that has the greatest likelihood of introducing the particular regression.