The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Oct. 30, 2008
Applicants:

Michael S. Buonpane, Easton, PA (US);

James D. Chlipala, Emmaus, PA (US);

Richard P. Martin, Macungie, PA (US);

Richard Muscavage, Gilbertsville, PA (US);

Scott A. Segan, Allentown, PA (US);

Inventors:

Michael S. Buonpane, Easton, PA (US);

James D. Chlipala, Emmaus, PA (US);

Richard P. Martin, Macungie, PA (US);

Richard Muscavage, Gilbertsville, PA (US);

Scott A. Segan, Allentown, PA (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/22 (2006.01); G06F 11/00 (2006.01); G06F 1/26 (2006.01); G01K 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for enhancing the performance of an IC are provided. A method of enhancing IC performance includes the steps of: associating at least one performance result of at least one performance monitor, formed on the IC, with deterministic combinations of IC performance and a processing parameter, a supply voltage, and/or a temperature of the IC; determining an IC processing characterization of the IC as a function of the performance result for at least one prescribed supply voltage and temperature of the IC, the IC processing characterization being indicative of a type of processing received by the IC during fabrication of the IC; and controlling a voltage supplied to at least a portion of the IC, the voltage being controlled as a function of the IC processing characterization and/or the temperature of the IC so as to satisfy at least one prescribed performance parameter of the IC.


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