The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Nov. 20, 2008
Applicants:
Marios Hadjieleftheriou, Madison, NJ (US);
Nick Koudas, Toronto, CA;
Divesh Srivastava, Summit, NJ (US);
Xiaohui Yu, Maple, CA;
Inventors:
Marios Hadjieleftheriou, Madison, NJ (US);
Nick Koudas, Toronto, CA;
Divesh Srivastava, Summit, NJ (US);
Xiaohui Yu, Maple, CA;
Assignee:
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a system and/or methodology for selectivity estimation of set similarity queries. More specifically, the invention relates to a selectivity estimation technique employing hashed sampling. The invention providing for samples constructed a priori that can efficiently and quickly provide accurate estimates for arbitrary queries, and can be updated efficiently as well.