The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Mar. 29, 2007
Naoki Watanabe, Tokyo, JP;
Masaru Tsukada, Tokyo, JP;
Katsunori Tagami, Tokyo, JP;
Mizuho Information & Research Institute, Inc., Chiyoda-ku, Tokyo, JP;
Waseda University, Shinjuku-ku, Tokyo, JP;
Abstract
A sample atomic configuration creation part in a control section creates the atomic arrangement data of a sample, and a sample surface height calculation part calculates a sample surface height for every mesh. A probe profile creation part creates the atomic arrangement data of a probe, and a probe surface height calculation part calculates the height of the probe surface for every mesh. A probe scanning part supplies the coordinate of a scanning start position in the scanning range to a collision height specification part. The collision height specification part calculates the distance between the sample surface and the probe in each mesh. Calculation of this distance is repeated for all meshes of the probe at the coordinate of this measuring position.