The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Dec. 12, 2008
Methods and apparatus to determine statistical dominance point descriptors for multidimensional data
Graham Cormode, Summit, NJ (US);
Philip Korn, New York, NY (US);
Divesh Srivastava, Summit, NJ (US);
Graham Cormode, Summit, NJ (US);
Philip Korn, New York, NY (US);
Divesh Srivastava, Summit, NJ (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
Methods and apparatus to determine statistical dominance point descriptors for multidimensional data are disclosed. An example method disclosed herein comprises determining a first joint dominance value for a first data point in a multidimensional data set, data points in the multidimensional data set comprising multidimensional values, each dimension corresponding to a different measurement of a physical event, the first joint dominance value corresponding to a number of data points in the multidimensional data set dominated by the first data point in every dimension, determining a first skewness value for the first data point, the first skewness value corresponding to a size of a first dimension of the first data point relative to a combined size of all dimensions of the first data point, and combining the first joint dominance and first skewness values to determine a first statistical dominance point descriptor associated with the first data point.