The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Nov. 29, 2006
Katrin Amunts, Welz, DE;
Karl Zilles, Köln, DE;
Hartmut Mohlberg, Düsseldorf, DE;
Axel Schleicher, Erftstadt, DE;
Lars Hömke, Köln, DE;
Katrin Amunts, Welz, DE;
Karl Zilles, Köln, DE;
Hartmut Mohlberg, Düsseldorf, DE;
Axel Schleicher, Erftstadt, DE;
Lars Hömke, Köln, DE;
Forschungszentrum Juelich GmbH, Juelich, DE;
Abstract
The invention relates to a method for the topographical presentation of structural alterations in an examined brain using volume data records. In line with the invention, this method is distinguished in that functional areas are mapped by extracting profiles, where the profiles record boundaries for two functional areas in the examined brain, in that the boundaries of the two functional areas are recorded by calculating a multivariant distance measurement, and in that a microstructure in the region of the boundaries of the two cortical areas is recorded and is compared with at least one microstructure in a boundary region of a reference brain. To increase the comparability of various areas in various brains taking into account the interindividual variability, it is expedient for the volume data records to be transformed to a target volume data record using an elastic registration method.