The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Nov. 24, 2008
Method and apparatus for measuring deposition of particulate contaminants in pulp and paper slurries
Mark Laurint, Jacksonville, FL (US);
Lloyd Lobo, Lincoln University, PA (US);
Catherine Kelly, Claymont, DE (US);
Mark Laurint, Jacksonville, FL (US);
Lloyd Lobo, Lincoln University, PA (US);
Catherine Kelly, Claymont, DE (US);
Hercules Incorporated, Wilmington, DE (US);
Abstract
A method and an apparatus for measuring the depositability of particulate contaminants present in a pulp or paper mill fluid stream and evaluating interactions of such particulate contaminants with other contaminants collects the particulate contaminants on a suitable substrate, such as a plastic film coated with an adhesive or coated with organic contaminate, placed in contact with the pulp or paper mill fluid stream for at least five minutes up to several hours. The amount of contaminants collected on the substrate is quantified and evaluated by taking one or more scanned images of the substrate with a resolution of at least 2,000 dots per inch (DPI) and analyzing the scanned images with image analysis technique.