The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Dec. 08, 2010
Applicants:

Xiaoye Wu, Rexford, NY (US);

David Allen Langan, Clifton Park, NY (US);

Jiang Hsieh, Brookfield, WI (US);

Robert Franklin Senzig, Germantown, WI (US);

Hao Lai, Rexford, NY (US);

Dan Xu, Waukesha, WI (US);

Thomas Matthew Benson, Clifton Park, NY (US);

Inventors:

Xiaoye Wu, Rexford, NY (US);

David Allen Langan, Clifton Park, NY (US);

Jiang Hsieh, Brookfield, WI (US);

Robert Franklin Senzig, Germantown, WI (US);

Hao Lai, Rexford, NY (US);

Dan Xu, Waukesha, WI (US);

Thomas Matthew Benson, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure relates to the generation of dual-energy X-ray data using a data sampling rate comparable to the rate utilized for single-energy imaging. In accordance with the present technique a reduced kVp switching rate is employed compared to conventional dual-energy imaging. Full angular resolution is achieved in the generated images.


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