The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Aug. 17, 2009
Applicants:

Martin Vetterli, Grandvaux, CH;

Pina Marziliano, Lausanne, CH;

Thierry Blu, Lausanne, CH;

Inventors:

Martin Vetterli, Grandvaux, CH;

Pina Marziliano, Lausanne, CH;

Thierry Blu, Lausanne, CH;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Reconstruction method for reconstructing a first signal (x(t)) regularly sampled at a sub-Nyquist rate, comprising the step of retrieving from the regularly spaced sampled values (y[n], y(nT)) a set of weights (c, c, c) and shifts (t, t) with which said first signal (x(t)) can be reconstructed. The reconstructed signal (x(t)) can be represented as a sequence of known functions (γ(t)) weighted by the weights (c) and shifted by the shifts (t). The sampling rate is at least equal to the rate of innovation (ρ) of the first signal (x(t)).


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