The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Oct. 16, 2008
Applicants:

Yoshihisa Adachi, Kyoto, JP;

Shigemi Maeda, Yamatokoriyama, JP;

Atsushi Etoh, Tenri, JP;

Inventors:

Yoshihisa Adachi, Kyoto, JP;

Shigemi Maeda, Yamatokoriyama, JP;

Atsushi Etoh, Tenri, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording parameter setting device including a trial recording parameter setting section and a reproduced signal quality judging section. The reproduced signal quality judging section judges whether or not a reproduced signal obtained by reproduction of the trial recording carried out in accordance with the trial recording parameter satisfies a predetermined reproduced signal quality. If no, the recording parameters of the predetermined recording mark length or longer are further classified into detailed groups and trial recording is carried out again. If the reproduced signal satisfies the predetermined reproduced signal quality, the reproduced signal quality judging section sets the trial recording parameters as a recording parameter. This makes it possible to form a recording mark capable of surely providing a good reproduced signal quality while the number of recording parameters to be used is reduced.


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