The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Dec. 22, 2008
Applicant:

Atsushi Tsurumune, Odawara, JP;

Inventor:

Atsushi Tsurumune, Odawara, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a laser scanning apparatus and a laser scanning microscope capable of securely conducting a condition setting at the time of laser scanning while suppressing a damage on a plane to be irradiated. Accordingly, a laser scanning apparatus includes a light deflecting unit disposed in a light path of laser light directed toward a plane to be scanned, user interfaces through which operational contents of the light deflecting unit are designated by a user, generating units generating driving signals of the light deflecting unit in accordance with the designated operational contents, and testing units test-driving the light deflecting unit with the driving signals while keeping the laser light off and measuring the operational contents of the light deflecting unit during the driving.


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