The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Aug. 04, 2005
Valentin M. Gelikonov, Nizhny Novgorod, RU;
Grigory V. Gelikonov, Nizhny Novgorod, RU;
Felix I. Feldchtein, Framingham, MA (US);
Valentin M. Gelikonov, Nizhny Novgorod, RU;
Grigory V. Gelikonov, Nizhny Novgorod, RU;
Felix I. Feldchtein, Framingham, MA (US);
Imalux Corporation, Cleveland, OH (US);
Abstract
Variants of an interferometric device are developed for examining internal structures of objects by means of optical coherence tomography, which allow for controlling a boundary location of the observation range. The device also allows for correcting a distortion of the tomographic image of the object under study, caused by lateral scanning, due to aberrations of the optical path length for the low-coherence optical radiation directed towards the object. Embodiments of the device include either one, or two fiber-optic controlled scanners, which in different combinations perform a function of in-depth scanning of the coherence window of low-coherence optical radiation within the observation range, a function of controlling a boundary location of the observation range, and a function of compensating the optical path length aberration for the low-coherence optical radiation directed towards the object, caused by lateral scanning.