The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Jul. 14, 2008
Wayne D. Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Alan R. Loudermilk, Chicago, IL (US);
Wayne D. Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Alan R. Loudermilk, Chicago, IL (US);
JJL Technologies LLC, Morton Grove, IL (US);
Abstract
Methods in a spectral measurement apparatus are disclosed. Light is received with a plurality of sensors. Each sensor generates an output signal having a frequency proportional to an intensity of light received by the sensor. First, second and third signals are generated each having a frequency proportional to an intensity of light received by a sensor of a wavelength or spectral band. A spectral characteristic of the received light is determined based on at least the first, second and third signals, which are are coupled to a processing element and input in parallel. The spectral characteristic is determined based on measuring a frequency or period of the at least first, second and third signals. Spectral data based on the determined spectral characteristic is generated by the processing element and displayed on a display device for perception by a viewer or transmitted to a data interface for transmission to an electronic device external to the spectral measurement apparatus.