The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Jul. 10, 2009
Yuji Maruyama, Shinjuku, JP;
Kazuhiro Tashiro, Shinjuku, JP;
Kazuhiko Shimabayashi, Shinjuku, JP;
Shigeru Goto, Shinjuku, JP;
Takayuki Nakashiro, Shinjuku, JP;
Susumu Koshinuma, Shinjuku, JP;
Masayoshi Shirakawa, Akiruno, JP;
Yuji Maruyama, Shinjuku, JP;
Kazuhiro Tashiro, Shinjuku, JP;
Kazuhiko Shimabayashi, Shinjuku, JP;
Shigeru Goto, Shinjuku, JP;
Takayuki Nakashiro, Shinjuku, JP;
Susumu Koshinuma, Shinjuku, JP;
Masayoshi Shirakawa, Akiruno, JP;
Fujitsu Semiconductor Limited, Yokohama, JP;
Abstract
A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.