The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Sep. 12, 2008
Jerome P. Lynch, Ann Arbor, MI (US);
Tsung-chin Huo, Ann Arbor, MI (US);
Nicholas A. Kotov, Ypsilanti, MI (US);
Nadine Wong Shi Kam, Ann Arbor, MI (US);
Kenneth J. Loh, Ann Arbor, MI (US);
Jerome P. Lynch, Ann Arbor, MI (US);
Tsung-Chin Huo, Ann Arbor, MI (US);
Nicholas A. Kotov, Ypsilanti, MI (US);
Nadine Wong Shi Kam, Ann Arbor, MI (US);
Kenneth J. Loh, Ann Arbor, MI (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
The present teachings relate to the application of electrical impedance tomography (EIT) to demonstrate the multifunctionality of carbon nanocomposite thin films under various types of environmental stimuli. Carbon nanotube (CNT) thin films are fabricated by a layer-by-layer (LbL) technique or other techniques and mounted with electrodes along their boundaries. The response of the thin films to various stimuli determined by relying on electric current excitation and corresponding boundary potential measurements. The spatial conductivity variations are reconstructed based on a mathematical model for the EIT technique. Here, the ability of the EIT method to provide two-dimensional mapping of the conductivity of CNT thin films is validated by (1) electrically imaging intentional structural defects in the thin films and (2) mapping the film's response to various pH environments.