The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Jul. 30, 2007
Applicant:

Jean-marc Decitre, Marcoussis, FR;

Inventor:

Jean-Marc Decitre, Marcoussis, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for making eddy current tests on an electrically conducting part (), in which a sensor moves above this part, uses separate emission/reception functions. The method includes obtaining a first complex voltage curve at the terminals of a reception winding (), obtaining at least one second complex voltage curve at the terminals of a reception winding, determining at least one given distance that minimizes the modulus of the difference between the first curve and the at least one second curve, calculating the arithmetic mean (d) of the at least one given distance, choosing this arithmetic mean+/−20% as the distance between the two emission and reception windings, and detecting if one or several defects are present in this part.


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