The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Feb. 03, 2009
Girish Bal, Niskayuna, NY (US);
Floribertus Heukensfeldt Jansen, Ballston Lake, NY (US);
Osnat Zak, Haifa, IL;
Gideon Berlad, Haifa, IL;
Yaron Hefetz, Herzeliya, IL;
Sergei Dolinsky, Clifton Park, NY (US);
Brian D. Yanoff, Niskayuna, NY (US);
John Eric Tkaczyk, Niskayuna, NY (US);
Yanfeng Du, Niskayuna, NY (US);
Ravindra Mohan Manjeshwar, Glenville, NY (US);
Evren Asma, Niskayuna, NY (US);
Qian Hua, Niskayuna, NY (US);
Girish Bal, Niskayuna, NY (US);
Floribertus Heukensfeldt Jansen, Ballston Lake, NY (US);
Osnat Zak, Haifa, IL;
Gideon Berlad, Haifa, IL;
Yaron Hefetz, Herzeliya, IL;
Sergei Dolinsky, Clifton Park, NY (US);
Brian D. Yanoff, Niskayuna, NY (US);
John Eric Tkaczyk, Niskayuna, NY (US);
Yanfeng Du, Niskayuna, NY (US);
Ravindra Mohan Manjeshwar, Glenville, NY (US);
Evren Asma, Niskayuna, NY (US);
Qian Hua, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An apparatus and methods for evaluating the operation of pixelated detectors are provided. The method includes obtaining data values for each of a plurality of pixels of a pixelated detector and determining a data consistency metric for each of the plurality of detector pixels. The method further includes identifying, using the determined data consistency metric, any detector pixels that exceed an acceptance criterion as noisy pixels.