The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Apr. 16, 2010
Applicants:

Michael W. Belford, Los Altos, CA (US);

Jean-jacques Dunyach, San Jose, CA (US);

Mark E. Hardman, Santa Clara, CA (US);

Inventors:

Michael W. Belford, Los Altos, CA (US);

Jean-Jacques Dunyach, San Jose, CA (US);

Mark E. Hardman, Santa Clara, CA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (b) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface that is disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode for defining an ion separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first position facilitating movement of the ions through the ion separation region, the second position facilitating movement of the ions through the conduit.


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