The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Dec. 23, 2008
Applicant:
Alex Sasha Nikittin, San Jose, CA (US);
Inventor:
Alex Sasha Nikittin, San Jose, CA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An image improvement system and method are disclosed that compensates for effects of optical scattering and pixel cross-talk on image quality in an imager employing a focal plane array. The method characterizes these effects on a test image, presents them as a set of stored numerical coefficients, and applies the coefficients during image processing.
Nikittin, Alex. (2012). System and method for improving the quality of thermal images (U.S. Patent No. 8158928). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8158928
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile