The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Jul. 01, 2009
Applicant:
Yoshiaki Irie, Yokohama, JP;
Inventor:
Yoshiaki Irie, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract
Foreign substance information about at last including a position of a foreign substance adhered to an optical element disposed in front of an image sensor is detected, and whether the position of the foreign substance overlaps a predetermined area of an object is determined by analyzing an image signal of the object generated by the image sensor. When it is determined that the position of the foreign substance overlaps the predetermined area of the object, a relative position of the image of the object formed on the image sensor and the image sensor is changed.