The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Dec. 18, 2008
Derk J. W. Klunder, Eindhoven, NL;
Derk J. W. Klunder, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An optical device provides evanescent radiation, in response to incident radiation, in a detection volume for containing a target component in a medium. The detection volume has at least one in-plane dimension (W) smaller than a diffraction limit. The diffraction limit is defined by the radiation wavelength and the medium. The evanescent radiation is provided by aperture defining structures having a smallest in plane aperture dimension (W) smaller than the diffraction limit. The detection volume is provided between the aperture defining structures. The aperture defining structures further define a largest in plane aperture dimension (W). The largest in plane aperture dimension is larger than the diffraction limit. A source is provided for emitting a beam of radiation having a wavelength incident at the optical device and having a direction of incidence non parallel to an out of plane normal direction, for providing the evanescent radiation in the detection volume, in response to the radiation incident at the optical device. The plane of incidence may be parallel to the largest in plane aperture dimension.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile