The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Apr. 10, 2007
Applicants:

Gregory G. Slabaugh, Princeton, NJ (US);

Gozde Unal, West Windsor, NJ (US);

Ti-chiun Chang, West Windsor, NJ (US);

Inventors:

Gregory G. Slabaugh, Princeton, NJ (US);

Gozde Unal, West Windsor, NJ (US);

Ti-chiun Chang, West Windsor, NJ (US);

Assignee:

Siemens Corporation, Iselin, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for feature detection in ultrasound images is disclosed. The method estimates speckle distributions in windows on opposing sides of a pixel of an ultrasound image. The divergence is calculated for the pixel between the estimated speckle distributions in the windows. These steps are performed for each pixel in the ultrasound image, and a feature map is generated based on the divergence calculated between the estimated speckle distributions for each pixel.


Find Patent Forward Citations

Slabaugh, Gregory. (2012). System and method for feature detection in ultrasound images (U.S. Patent No. 8157736). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8157736

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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