The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Mar. 04, 2009
Munendra S. Tomar, Houston, TX (US);
Martin Fingerhut, League City, TX (US);
Deli Yu, Edmonton, CA;
Röntgen Technische Dienst B.V., Rotterdam, NL;
Abstract
Method for non-destructive inspection of defects in a surface of a pipeline or storage tank. The method includes carrying out a first way of non-destructive inspection for determining a first defect pattern and carrying out a second way of non-destructive inspection for determining a second defect pattern. The method includes identifying at least one defect of the first defect pattern and at least one defect of the second defect pattern which represent one and the same defect, and comparing the dimensions and optionally also the positions of the identified defects so as to obtain a difference in dimensions and optionally also in the positions. The method also includes obtaining a plurality of such differences and obtaining at least one parameter representing said differences, and correcting the dimensions and optionally also the positions of defects of the first defect pattern by using the at least one parameter.