The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2012

Filed:

Jul. 02, 2010
Applicants:

Fulu LI, Foster City, CA (US);

Mohsin Beg, Foster City, CA (US);

Inventors:

Fulu Li, Foster City, CA (US);

Mohsin Beg, Foster City, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for determining that problems have occurred within a complex multi-host system and for identifying for each problem, sequences of causes and effects called a fault cause path, starting with a root cause. A probabilistic model representing the cause/effect relationships among potential system problems identifies the probability that a problem occurred in the system. Such failure probabilities may be determined based on aggregating, over a recent time interval, probability of failure values determined by the probabilistic model. Each fault cause path may have an associated probability of accuracy value reflecting the expected accuracy of the fault cause path relative to other fault cause paths. When more than one fault cause path is identified, the number and order of the fault cause paths may be ranked and displayed based on their probability of accuracy value.


Find Patent Forward Citations

Loading…