The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2012

Filed:

Mar. 26, 2003
Applicants:

Karl Andersson, Uppsala, SE;

Peter Borg, Uppsala, SE;

Inventors:

Karl Andersson, Uppsala, SE;

Peter Borg, Uppsala, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of analysis wherein molecular interactions at one or more sensing surface areas are detected and respective response curves representing the progress of each interaction with time are produced, and wherein a resulting set of response curves is subjected to a quality assessment procedure which comprises representing the response curves with one or more quality descriptors, applying a quality classification method to the descriptors to find outliers, and removing the outliers. The invention also relates to an analytical system including means for classifying the response curves with regard to quality, a computer program for performing the classification, and a computer program product containing the program.


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