The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Oct. 08, 2008
Kathleen Minear, Palm Bay, FL (US);
Kathleen Minear, Palm Bay, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A method for correlating or finding similarity between two data sets. The method can be used for correlating two images with common scene content in order to find correspondence points between the data sets. These correspondence points then can be used to find the transformation parameters which when applied to image 2 brings it into alignment with image 1. The correlation metric has been found to be invariant under image rotation and when applied to corresponding areas of a reference and target image, creates a correlation surface superior to phase and norm cross correlation with respect to the correlation peak to correlation surface ratio. The correlation metric was also found to be superior when correlating data from different sensor types such as from SAR and EO sensors. This correlation method can also be applied to data sets other than image data including signal data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile