The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Mar. 15, 2007
Andy Ziegler, Hamburg, DE;
Ewald Roessl, Ellerau, DE;
Andy Ziegler, Hamburg, DE;
Ewald Roessl, Ellerau, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
It is described a method for dynamically optimizing the signal-to-noise ratio of attenuation data related to two different X-ray energies for reconstructing an image of an object under examination. The method comprises (a) estimating the thickness and the material composition of the object at a plurality of different projection angles, (b) for each of the various projection angles calculating for a variety of combinations of different first and second X-ray energies a corresponding common signal-to-noise ratio, (c) for each of the various projection angles choosing the first and the second X-ray energy causing the maximum corresponding common signal-to-noise ratio, and (d) for each of the various projection angles acquiring X-ray attenuation data of the object whereby the two X-ray energies are the X-ray energies causing a maximum signal-to-noise ratio assigned to the respective projection angle.