The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
May. 21, 2009
Michael G. Meyer, Seattle, WA (US);
Rahul Katdare, Seattle, WA (US);
David Ethan Steinhauer, Lynnwood, WA (US);
J. Richard Rahn, Sammamish, WA (US);
Michael G. Meyer, Seattle, WA (US);
Rahul Katdare, Seattle, WA (US);
David Ethan Steinhauer, Lynnwood, WA (US);
J. Richard Rahn, Sammamish, WA (US);
Visiongate, Inc, Phoenix, AZ (US);
Abstract
A system and method for detecting poor quality images in an optical tomography system includes an acquisition apparatus for acquiring a set of pseudo-projection images of an object having a center of mass, where each of the set of pseudo-projection images is acquired at a different angle of view. A reconstruction apparatus is coupled to receive the pseudo-projection images, for reconstruction of the pseudo-projection images into 3D reconstruction images. A quality apparatus is coupled to receive the 3D reconstruction images and operates to detect of selected features that characterize poor quality reconstructions.