The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2012

Filed:

Aug. 14, 2008
Applicants:

Richard Franklin Eilbert, Lincoln, MA (US);

Boris Oreper, Newton, MA (US);

Nikolay Rolshud, Winchester, MA (US);

Inventors:

Richard Franklin Eilbert, Lincoln, MA (US);

Boris Oreper, Newton, MA (US);

Nikolay Rolshud, Winchester, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 35/06 (2006.01); H01J 35/30 (2006.01); G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.


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