The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Oct. 05, 2011
William B. Boyle, Lake Forest, CA (US);
Srinivas Neppalli, Lake Forest, CA (US);
William B. Boyle, Lake Forest, CA (US);
Srinivas Neppalli, Lake Forest, CA (US);
Western Digital Technologies, Inc., Irvine, CA (US);
Abstract
The embodiments relate to optimizing a defect log of a storage device, such as a disk drive. The defect log may comprise entries for individual locations, such as sectors on a disk, and entries indicating zones. A zone comprises a plurality of locations in the medium of the storage device and may contain adjacent or non-adjacent defects. One or more medium of the storage device may be scanned for defects and locations of these defects are recorded in the defect log. The defect log may then be analyzed to determine if certain number of defects are in proximity to each other, adjacent or non-adjacent, within a zone. If the defects within a zone exceed a threshold, then the defect log may be condensed by coalescing the individual entries of the defects into zone entries. In addition, the defect log may be further condensed by coalescing zone entries of adjacent zones into combined entries.