The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Nov. 07, 2006
Makoto Araki, Kanagawa, JP;
Hiroshi Sasaki, Tokyo, JP;
Tatsuo Nakata, Tokyo, JP;
Makio Ueno, Nagano, JP;
Makoto Araki, Kanagawa, JP;
Hiroshi Sasaki, Tokyo, JP;
Tatsuo Nakata, Tokyo, JP;
Makio Ueno, Nagano, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope apparatus that can observe into the interior of a specimen and that can apply an optical stimulus over a wide area within a short period of time is provided. The microscope apparatus comprises at least one observation scanning optical system including a laser light source for emitting observation laser light, an objective lens, and a scanning optical system for two-dimensionally scanning the observation laser light in a predetermined examination plane of the specimen via the objective lens; and at least one stimulus optical system which includes a lamp light source for emitting light having a wavelength used for optical stimulation and which irradiates the specimen with the light emitted from the lamp light source.