The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Apr. 03, 2009
Yongji Fu, Aloha, OR (US);
Deepak Ayyagari, Vancouver, WA (US);
Yongji Fu, Aloha, OR (US);
Deepak Ayyagari, Vancouver, WA (US);
Sharp Laboratories of America, Inc., Camas, WA (US);
Abstract
Methods and systems for particle characterization using a light fluctuation component of an optical sensor output signal. The use of the light fluctuation component enables particle characterization (e.g. provision of information on particle size, type and confidence) without requiring measurements at multiple wavelengths or multiple angles and using relatively lightweight calculations. The methods and systems allow integration of real-time airborne particle characterization into portable monitors. The methods and systems in some embodiments also use the output signal to further characterize particles through determination of particle density information.